Inventor · disambiguated record
Deepak Goyal
Also filed as: GOYAL DEEPAK · GOYAL DEEPAK K
34 granted patents·10 pending applications·303 citations·filing 1974–2025
96Inventor score
Top patents by PatentIndex Score
44 records- 0194US10935593B2Method of resonance analysis for electrical fault isolationINTEL CORP·Filed 2017·Granted Mar 2, 2021·21 cites·26 claims
- 0291US7171407B2Method for streaming XPath processing with forward and backward axesIBM·Filed 2002·Granted Jan 30, 2007·100 cites·17 claims
- 0387US10754518B1Techniques for providing customized user interface components in a push notificationAMAZON TECH INC·Filed 2016·Granted Aug 25, 2020·13 cites·19 claims
- 0487US7350168B1System, method and computer program product for equivalence checking between designs with sequential differencesCALYPTO DESIGN SYSTEMS INC·Filed 2005·Granted Mar 25, 2008·23 cites·26 claims
- 0584US7222317B1Circuit comparison by information loss matchingCALYPTO DESIGNS SYSTEMS·Filed 2004·Granted May 22, 2007·51 cites·8 claims
- 0681US11346818B2Method, device and system for non-destructive detection of defects in a semiconductor dieINTEL CORP·Filed 2020·Granted May 31, 2022·2 cites·18 claims
- 0781US9746428B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2016·Granted Aug 29, 2017·3 cites·20 claims
- 0880US10361167B2Electronic assembly using bismuth-rich solderINTEL CORP·Filed 2015·Granted Jul 23, 2019·4 cites·17 claims
- 0979US9389064B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2014·Granted Jul 12, 2016·4 cites·12 claims
- 1077US9508610B2Inline measurement of molding material thickness using terahertz reflectanceINTEL CORP·Filed 2014·Granted Nov 29, 2016·5 cites·15 claims
- 1176US9625256B1Device, system and method for alignment of an integrated circuit assemblyINTEL CORP·Filed 2015·Granted Apr 18, 2017·3 cites·20 claims
- 1274US8122401B1System, method, and computer program product for determining equivalence of netlists utilizing at least one transformationCHAUHAN PANKAJ P·Filed 2008·Granted Feb 21, 2012·8 cites·24 claims
- 1368US2025238246A1Automatically executing application routines with user inputsGOOGLE LLC·Filed 2025·Application pending·0 cites
- 1467US12271742B2Automatically executing application routines with user inputsGOOGLE LLC·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 1567US3997882AContent addressable memory system employing charge coupled device storage and directory registers and N/(1-H) counter refresh synchronizationBURROUGHS CORP·Filed 1975·Granted Dec 14, 1976·27 cites·24 claims
- 1665US7280190B1Electro-optic time domain reflectometryINTEL CORP·Filed 2006·Granted Oct 9, 2007·4 cites·19 claims
- 1765US2025013438A1Script editor for routine creationGOOGLE LLC·Filed 2024·Application pending·0 cites
- 1864US9817028B2Terahertz transmission contactless probing and scanning for signal analysis and fault isolationINTEL CORP·Filed 2015·Granted Nov 14, 2017·1 cites·25 claims
- 1962US9291576B2Detection of defect in dieINTEL CORP·Filed 2014·Granted Mar 22, 2016·1 cites·21 claims
- 2062US8117571B1System, method, and computer program product for determining equivalence of netlists utilizing abstractions and transformationsCHAUHAN PANKAJ P·Filed 2008·Granted Feb 14, 2012·3 cites·27 claims
- 2161US11506709B2X-ray filterINTEL CORP·Filed 2018·Granted Nov 22, 2022·0 cites·20 claims
- 2261US10908206B2Characterization of transmission mediaINTEL CORP·Filed 2016·Granted Feb 2, 2021·1 cites·25 claims
- 2361US7287235B1Method of simplifying a circuit for equivalence checkingCALYPTO DESIGN SYSTEMS INC·Filed 2004·Granted Oct 23, 2007·10 cites·9 claims
- 2460US3942163ACCD stack memory organizationBURROUGHS CORP·Filed 1974·Granted Mar 2, 1976·19 cites·10 claims
- 2557US12308299B2TEC-embedded dummy die to cool the bottom die edge hotspotINTEL CORP·Filed 2020·Granted May 20, 2025·0 cites·25 claims
- 2655US11551956B2Method and device for failure analysis using RF-based thermometryINTEL CORP·Filed 2020·Granted Jan 10, 2023·0 cites·20 claims
- 2752US10078204B2Non-destructive 3-dimensional chemical imaging of photo-resist materialINTEL CORP·Filed 2014·Granted Sep 18, 2018·0 cites·36 claims
- 2851US11798861B2Integrated heat spreader (IHS) with heating elementINTEL CORP·Filed 2019·Granted Oct 24, 2023·0 cites·20 claims
- 2949US12094800B2Thermally conductive slugs/active dies to improve cooling of stacked bottom diesINTEL CORP·Filed 2019·Granted Sep 17, 2024·0 cites·18 claims
- 3046US11791237B2Microelectronic assemblies including a thermal interface materialINTEL CORP·Filed 2018·Granted Oct 17, 2023·0 cites·13 claims
- 3143US10936232B1Methods and apparatus for data repartitioningWALMART APOLLO LLC·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 3243US10746780B2High power terahertz impulse for fault isolationINTEL CORP·Filed 2015·Granted Aug 18, 2020·0 cites·23 claims
- 3342US11138077B2System and method for bootstrapping replicas from active partitionsWALMART APOLLO LLC·Filed 2019·Granted Oct 5, 2021·0 cites·20 claims
- 3441US2015255414A1Solder alloy to enhance reliability of solder interconnects with nipdau or niau surface finishes during high temperature exposureLIU PILIN·Filed 2014·Application pending·0 cites
- 3541US2007214422A1Framework for implementing skins into a portal serverSUN MICROSYSTEMS INC·Filed 2006·Application pending·0 cites
- 3640US11476120B2Method of sample preparation using dual ion beam trenchingINTEL CORP·Filed 2017·Granted Oct 18, 2022·0 cites·9 claims
- 3740US11281657B2Event-driven identity graph conflationWALMART APOLLO LLC·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 3839US2007067426A1Computer implemented methods for transferring files from a development environment to target mobile devicesSUN MICROSYSTEMS INC·Filed 2005·Application pending·0 cites
- 3937US2016274044A1Circuit device inspection systems using temperature gradientsINTEL CORP·Filed 2015·Application pending·0 cites
- 4036US2018283845A1Wavelength modulatable interferometerINTEL CORP·Filed 2017·Application pending·0 cites
- 4132US11226353B2Integrated cable probe design for high bandwidth RF testingINTEL CORP·Filed 2017·Granted Jan 18, 2022·0 cites·21 claims
- 4232US2017170080A1Material thickness device and methodINTEL CORP·Filed 2015·Application pending·0 cites
- 4332US2017176173A1Measuring surface layer thicknessINTEL CORP·Filed 2015·Application pending·0 cites
- 4431US2017284943A1Detecting voids and delamination in photoresist layerGHOSH NILANJAN·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →