Inventor · disambiguated record
Derek Lieber
Also filed as: LIEBER DEREK · LIEBER SIDNEY · WEINSTOCK JACQUES
6 granted patents·2 pending applications·168 citations·filing 1977–2006
85Inventor score
Top patents by PatentIndex Score
8 records- 0181US4155009AThickness measurement instrument with memory storage of multiple calibrationsUNIT PROCESS ASSEMBLIES·Filed 1977·Granted May 15, 1979·37 cites·17 claims
- 0276US6182281B1Incremental compilation of C++ programsIBM·Filed 1997·Granted Jan 30, 2001·85 cites·31 claims
- 0373US4245189AProbe assembly for measuring conductivity of plated through holesUPA TECHNOLOGY INC·Filed 1979·Granted Jan 13, 1981·28 cites·18 claims
- 0446US4190770ABackscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Feb 26, 1980·9 cites·9 claims
- 0544US2008059676A1Efficient deferred interrupt handling in a parallel computing environmentARCHER CHARLES JENS·Filed 2006·Application pending·0 cites
- 0644US2008059677A1Fast interrupt disabling and processing in a parallel computing environmentARCHER CHARLES JENS·Filed 2006·Application pending·0 cites
- 0735US4115690ABackscatter instrument for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Sep 19, 1978·5 cites·4 claims
- 0833US4229652ABackscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1978·Granted Oct 21, 1980·4 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →