Inventor · disambiguated record
Dennis M. Petrich
Also filed as: PETRICH DENNIS · PETRICH DENNIS M
10 granted patents·2 pending applications·678 citations·filing 1980–2004
93Inventor score
Top patents by PatentIndex Score
12 records- 0193US4574235ATransmission line connector and contact set assembly for test siteMICRO COMPONENT TECHNOLOGY INC·Filed 1981·Granted Mar 4, 1986·122 cites·23 claims
- 0292US4517512AIntegrated circuit test apparatus test headMICRO COMPONENT TECHNOLOGY INC·Filed 1982·Granted May 14, 1985·184 cites·43 claims
- 0391US6356850B1Method and apparatus for jitter analysisWAVECREST CORP·Filed 1999·Granted Mar 12, 2002·82 cites·37 claims
- 0486US4338569ADelay lock loopCONTROL DATA CORP·Filed 1980·Granted Jul 6, 1982·66 cites·21 claims
- 0583US4309673ADelay lock loop modulator and demodulatorCONTROL DATA CORP·Filed 1980·Granted Jan 5, 1982·41 cites·3 claims
- 0682US6449570B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 2000·Granted Sep 10, 2002·24 cites·9 claims
- 0782US6185509B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 1998·Granted Feb 6, 2001·46 cites·20 claims
- 0878US6298315B1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 1998·Granted Oct 2, 2001·64 cites·17 claims
- 0978US4527126AAC parametric circuit having adjustable delay lock loopMICRO COMPONENT TECHNOLOGY INC·Filed 1983·Granted Jul 2, 1985·31 cites·16 claims
- 1076US6799144B2Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2001·Granted Sep 28, 2004·18 cites·74 claims
- 1147US2005027477A1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2004·Application pending·0 cites
- 1244US2002120420A1Method and apparatus for jitter analysisWAVECREST CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →