Inventor · disambiguated record
Detlev Richter
Also filed as: RICHTER DETLEV · RICHTER DETLEV ANDREAS
31 granted patents·4 pending applications·282 citations·filing 1976–2013
97Inventor score
Files withQIMONDA AG12INFINEON TECHNOLOGIES AG7PHILIPS CORP3QIMONDA FLASH GMBH2QIMONDA FLASH GMBH & CO KG2
Top patents by PatentIndex Score
35 records- 0188US7800943B2Integrated circuit having a memory cell arrangement and method for reading a memory cell state using a plurality of partial readingsQIMONDA AG·Filed 2008·Granted Sep 21, 2010·28 cites·25 claims
- 0288US7688634B2Method of operating an integrated circuit having at least one memory cellQIMONDA AG·Filed 2007·Granted Mar 30, 2010·21 cites·48 claims
- 0385US4121104AX-ray examining device with automatic timer and film container for an X-ray examining devicePHILIPS CORP·Filed 1976·Granted Oct 17, 1978·14 cites·10 claims
- 0482US7649779B2Integrated circuits; methods for manufacturing an integrated circuit; memory modules; computing systemsQIMONDA AG·Filed 2007·Granted Jan 19, 2010·16 cites·71 claims
- 0580US7864579B2Integrated circuits having a controller to control a read operation and methods for operating the sameQIMONDA AG·Filed 2008·Granted Jan 4, 2011·15 cites·4 claims
- 0677US8589765B1Memory read-outQIMONDA AG·Filed 2013·Granted Nov 19, 2013·5 cites·20 claims
- 0777US7940575B2Memory device and method providing logic connections for data transferQIMONDA AG·Filed 2008·Granted May 10, 2011·9 cites·15 claims
- 0877US7813169B2Integrated circuit and method to operate an integrated circuitQIMONDA FLASH GMBH·Filed 2008·Granted Oct 12, 2010·11 cites·18 claims
- 0975US7778073B2Integrated circuit having NAND memory cell stringsQIMONDA AG·Filed 2007·Granted Aug 17, 2010·9 cites·18 claims
- 1069US6297995B1Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuitSIEMENS AG·Filed 1999·Granted Oct 2, 2001·40 cites·8 claims
- 1161US7864593B2Method for classifying memory cells in an integrated circuitQIMONDA AG·Filed 2007·Granted Jan 4, 2011·5 cites·27 claims
- 1261US7190605B1Semiconductor memory and method for operating a semiconductor memory comprising a plurality of memory cellsINFINEON TECHNOLOGIES FLASH GM·Filed 2005·Granted Mar 13, 2007·5 cites·20 claims
- 1360US6216248B1Integrated memorySIEMENS AG·Filed 1999·Granted Apr 10, 2001·22 cites·7 claims
- 1459US7783826B2Data bus width converterQIMONDA AG·Filed 2006·Granted Aug 24, 2010·2 cites·17 claims
- 1558US7636258B2Integrated circuits, memory controller, and memory modulesQIMONDA FLASH GMBH·Filed 2007·Granted Dec 22, 2009·5 cites·21 claims
- 1658US7296202B2Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 13, 2007·8 cites·13 claims
- 1757US7707380B2Memories, method of storing data in memory and method of determining memory cell sector qualityQIMONDA AG·Filed 2006·Granted Apr 27, 2010·4 cites·17 claims
- 1857US6779136B2Method for testing the refresh device of an information memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 17, 2004·10 cites·10 claims
- 1954US7489563B2Memory device with adaptive sense unit and method of reading a cell arrayQIMONDA FLASH GMBH & CO KG·Filed 2007·Granted Feb 10, 2009·5 cites·37 claims
- 2052US4486896AX-Ray generator incorporating automatic correction of a dose-determining exposure parameterPHILIPS CORP·Filed 1982·Granted Dec 4, 1984·12 cites·7 claims
- 2150US7457144B2Memory device and method for verifying information stored in memory cellsQIMONDA FLASH GMBH & CO KG·Filed 2006·Granted Nov 25, 2008·2 cites·33 claims
- 2243US7920430B2Integrated circuits and methods for operating the same using a plurality of buffer circuits in an access operationQIMONDA AG·Filed 2008·Granted Apr 5, 2011·1 cites·11 claims
- 2343US6877897B2Method for determining the temperature of a memory cell from transistor threshold voltageINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 12, 2005·4 cites·3 claims
- 2443US4313055AAutomatic exposure control device for an X-ray generatorPHILIPS CORP·Filed 1979·Granted Jan 26, 1982·6 cites·8 claims
- 2541US8533563B2Memory read-outSCHEPPLER MICHAEL·Filed 2008·Granted Sep 10, 2013·0 cites·3 claims
- 2639US6279129B1Configuration of memory cells and method of checking the operation of memory cellsINFINEON TECHNOLOGIES AG·Filed 1999·Granted Aug 21, 2001·7 cites·4 claims
- 2738US7602649B2Method of operating an integrated circuit for reading the logical state of a memory cellQIMONDA AG·Filed 2007·Granted Oct 13, 2009·0 cites·19 claims
- 2838USD548871SLampKALMERIC GBR·Filed 2005·Granted Aug 14, 2007·8 cites·1 claims
- 2938US6910163B2Method and configuration for the output of bit error tables from semiconductor devicesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 21, 2005·2 cites·19 claims
- 3038US2009282308A1Memory Cell Arrangement and Method for Reading State Information From a Memory Cell Bypassing an Error Detection CircuitGUTSCHE JAN·Filed 2008·Application pending·0 cites
- 3133US7437629B2Method for checking the refresh function of an information memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 14, 2008·0 cites·8 claims
- 3233US6158029AMethod of testing an integrated circuit having a memory and a test circuitINFINEON TECHNOLOGIES AG·Filed 1999·Granted Dec 5, 2000·6 cites·1 claims
- 3330US2008080226A1Memory system and method of operating the memory systemMIKOLAJICK THOMAS·Filed 2006·Application pending·0 cites
- 3428US2007025167A1Method for testing a memory device, test unit for testing a memory device and memory deviceZIEGELMAYER MARCO·Filed 2005·Application pending·0 cites
- 3528US2008080252A1Methods of programming a memory cell and memory cell arrangementsSPIELBERG RAINER·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →