Inventor · disambiguated record
Dennis K. Wickenden
Also filed as: WICKENDEN DENNIS K
10 granted patents·2 pending applications·558 citations·filing 1977–2006
91Inventor score
Files withUNIV JOHNS HOPKINS6CRYSTAL SPECIALTIES INC1ELLIOTT BROTHERS LONDON LTD1GEN ELECTRIC CO LTD1GEN ELECTRIC CO PLC1
Top patents by PatentIndex Score
12 records- 0195US4761269AApparatus for depositing material on a substrateCRYSTAL SPECIALTIES INC·Filed 1986·Granted Aug 2, 1988·367 cites·15 claims
- 0285US4335501AManufacture of monolithic LED arrays for electroluminescent display devicesGEN ELECTRIC CO LTD·Filed 1980·Granted Jun 22, 1982·63 cites·10 claims
- 0375US5998995AMicroelectromechanical (MEMS)-based magnetostrictive magnetometerUNIV JOHNS HOPKINS·Filed 1997·Granted Dec 7, 1999·40 cites·10 claims
- 0474US6819103B2Lorentz force driven mechanical filter/mixer designs for RF applicationsUNIV JOHNS HOPKINS·Filed 2002·Granted Nov 16, 2004·17 cites·9 claims
- 0562US5959452ALorentz force magnetometer having a resonatorUNIV JOHNS HOPKINS·Filed 1997·Granted Sep 28, 1999·25 cites·7 claims
- 0658US4546373ASemiconductor device with a tantalum iridium barrier layer contact structureGEN ELECTRIC CO PLC·Filed 1984·Granted Oct 8, 1985·16 cites·6 claims
- 0752US6985058B2Lorentz force assisted switchUNIV JOHNS HOPKINS·Filed 2003·Granted Jan 10, 2006·7 cites·7 claims
- 0846US6727511B2Sensor array system for object position detectionUNIV JOHNS HOPKINS·Filed 2001·Granted Apr 27, 2004·8 cites·6 claims
- 0946US4182025AManufacture of electroluminescent display devicesELLIOTT BROTHERS LONDON LTD·Filed 1977·Granted Jan 8, 1980·11 cites·3 claims
- 1041US7064541B2Complementary metal-oxide semiconductor xylophone bar magnetometer with automatic resonance controlUNIV JOHNS HOPKINS·Filed 2004·Granted Jun 20, 2006·4 cites·10 claims
- 1135US2006193356A1Die level optical transduction systemsOSIANDER ROBERT·Filed 2006·Application pending·0 cites
- 1234US2007001671A1Magnetostrictive MEMS based magnetometerPARK RUDOLPH V·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →