Inventor · disambiguated record
Dennis S. Yee
Also filed as: YEE DENNIS S · YEE DENNIS SEK-ON
6 granted patents·102 citations·filing 1982–1995
84Inventor score
Files withIBM6
Top patents by PatentIndex Score
6 records- 0166US6258497B1Precise endpoint detection for etching processesIBM·Filed 1995·Granted Jul 10, 2001·38 cites·14 claims
- 0263US4416725ACopper texturing processIBM·Filed 1982·Granted Nov 22, 1983·16 cites·9 claims
- 0356US4925700AProcess for fabricating high density disc storage deviceIBM·Filed 1988·Granted May 15, 1990·11 cites·15 claims
- 0455US5206213AMethod of preparing oriented, polycrystalline superconducting ceramic oxidesIBM·Filed 1990·Granted Apr 27, 1993·20 cites·25 claims
- 0543US5064681ASelective deposition process for physical vapor depositionIBM·Filed 1989·Granted Nov 12, 1991·11 cites·19 claims
- 0632US5420057ASimplified contact method for high density CMOSIBM·Filed 1994·Granted May 30, 1995·6 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →