Inventor · disambiguated record
Dimitri Boguslavsky
Also filed as: BOGUSLAVSKY DIMITRI
0 granted patents·3 pending applications·0 citations·filing 2005–2012
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0140US2008308727A1Sample Preparation for Micro-AnalysisSELA SEMICONDUCTOR ENG LABORATORIES·Filed 2006·Application pending·0 cites
- 0239US2008078750A1Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent ThereofSELA SEMICONDUCTOR ENG LABORATORIES·Filed 2005·Application pending·0 cites
- 0339US2013180843A1Directed multi-deflected ion beam milling of a work piece and determining and controlling extent thereofBOGUSLAVSKY DIMITRI·Filed 2012·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Dimitri Boguslavsky files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →