Inventor · disambiguated record
Dirk Fey
Also filed as: FEY DIRK
7 granted patents·4 pending applications·85 citations·filing 1999–2021
79Inventor score
Top patents by PatentIndex Score
11 records- 0187US9358636B2Laser processing machineHAMMANN GERHARD·Filed 2010·Granted Jun 7, 2016·13 cites·3 claims
- 0279US6509537B1Method and device for detecting and differentiating between contaminations and accepts as well as between different colors in solid particlesKRIEG GUNTHER·Filed 1999·Granted Jan 21, 2003·69 cites·24 claims
- 0378US10533943B2Method and apparatus for identifying plastics and/or the additives thereinUNISENSOR SENSORSYSTEME GMBH·Filed 2016·Granted Jan 14, 2020·3 cites·26 claims
- 0457US8587785B2Sample chamber for monitoring the concentration of components of additives in a printing process liquidFEY DIRK·Filed 2012·Granted Nov 19, 2013·0 cites·8 claims
- 0554US8635955B2Method and device for regulating the concentration of components of additives in a printing process liquidFEY DIRK·Filed 2006·Granted Jan 28, 2014·0 cites·27 claims
- 0652US2021255187A1Method for predicting the effectiveness of treatments for cancer patientsUNIV COLLEGE DUBLIN NAT UNIV IRELAND DUBLIN·Filed 2021·Application pending·0 cites
- 0749US2025085232A1Apparatus and method for examining containers for impuritiesUNISENSOR SENSORSYSTEME GMBH·Filed 2021·Application pending·0 cites
- 0843US11548036B2Device and method for inspecting containers for the presence of foreign matterKRIEG GUNTHER·Filed 2017·Granted Jan 10, 2023·0 cites·19 claims
- 0936US12123832B2Apparatus for identifying substancesKRIEG GUNTHER·Filed 2017·Granted Oct 22, 2024·0 cites·22 claims
- 1032US2009015820A1Method and apparatus for the analysis of foreign gas phase in containersBOHE THOMAS·Filed 2007·Application pending·0 cites
- 1131US2007242273A1Spectroscopic deviceGUNTHER KRIEG·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →