Inventor · disambiguated record
Dieter Michel
Also filed as: MICHEL DIETER
27 granted patents·718 citations·filing 1977–2000
97Inventor score
Top patents by PatentIndex Score
27 records- 0194US5396328AWaveguide type displacement interferometer having two reference pathsHEIDENHAIN GMBH DR JOHANNES·Filed 1991·Granted Mar 7, 1995·114 cites·7 claims
- 0291US5631736AAbsolute interferometer measuring process and apparatus having a measuring interferometer, control interferometer and tunable laserHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted May 20, 1997·103 cites·20 claims
- 0384US6605828B1Optoelectronic component with a space kept free from underfillerHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Aug 12, 2003·61 cites·23 claims
- 0481US6486467B1Optical detector for measuring relative displacement of an object on which a grated scale is formedJOHANNES HEIDEN HAIN GMBH DR·Filed 1999·Granted Nov 26, 2002·70 cites·28 claims
- 0581US5333048APolarizing interferometric displacement measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 1993·Granted Jul 26, 1994·39 cites·11 claims
- 0677US4677293APhotoelectric measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1985·Granted Jun 30, 1987·26 cites·14 claims
- 0775US6885457B1Rotary position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Apr 26, 2005·33 cites·25 claims
- 0875US5521704AApparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laserFiled 1994·Granted May 28, 1996·36 cites·19 claims
- 0974US4778273APhotoelectric measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1987·Granted Oct 18, 1988·23 cites·16 claims
- 1068US5079418APosition measuring apparatus with reflectionHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Jan 7, 1992·24 cites·19 claims
- 1167US6621104B1Integrated optoelectronic thin-film sensor and method of producing sameHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Sep 16, 2003·12 cites·29 claims
- 1267US5061073APhotoelectric position measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 1989·Granted Oct 29, 1991·18 cites·15 claims
- 1367US4955718APhotoelectric measuring system with integrated optical circuit including and illuminating systemHEIDENHAIN GMBH DR JOHANNES·Filed 1988·Granted Sep 11, 1990·18 cites·6 claims
- 1466US5880882AScale and method for making a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Mar 9, 1999·24 cites·14 claims
- 1560US4766310APhotoelectric position measuring instrument with gridsHEIDENHAIN GMBH DR JOHANNES·Filed 1986·Granted Aug 23, 1988·14 cites·10 claims
- 1660US4155647AOptical apparatus for ballistic measurementsHEIDENHAIN GMBH DR JOHANNES·Filed 1977·Granted May 22, 1979·12 cites·8 claims
- 1754US5760959AInterferential position measuring device with three detectorsHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Jun 2, 1998·17 cites·5 claims
- 1853US4923300ADefraction photoelectric position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1988·Granted May 8, 1990·11 cites·13 claims
- 1948US5113066AIntegrated optical sensor arrangement with detecting means, and means for controlling the optical emission wavelength of the light beam sourceHEIDENHAIN GMBH DR JOHANNES·Filed 1991·Granted May 12, 1992·13 cites·13 claims
- 2046US5162869AApparatus and method having at least one waveguide coupler to create at least two signals having a mutual phase shift not equal to 180 degreesHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Nov 10, 1992·9 cites·13 claims
- 2145US4512083AMeasuring apparatusHEIDENHAIN GMBH DR JOHANNES·Filed 1984·Granted Apr 23, 1985·5 cites·14 claims
- 2244US5559599AGraduation scale having a continuous planar surface with a protective diffusion barrier layer thereonHEIDENHAIN GMBH DR JOHANNES·Filed 1994·Granted Sep 24, 1996·10 cites·23 claims
- 2343US4505580AMethod and apparatus for generating exposure masksHEIDENHAIN GMBH DR JOHANNES·Filed 1982·Granted Mar 19, 1985·3 cites·13 claims
- 2442US4988864APhotoelectric angle measuring device with adjacent order interferenceHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Jan 29, 1991·8 cites·14 claims
- 2542US4253020AApparatus for measuring projectile velocityHEIDENHAIN GMBH DR JOHANNES·Filed 1978·Granted Feb 24, 1981·5 cites·3 claims
- 2640US4843237APhotoelectric length and angle measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1987·Granted Jun 27, 1989·5 cites·19 claims
- 2734US5001340AAngle measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 1989·Granted Mar 19, 1991·5 cites·14 claims
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