Inventor · disambiguated record
Dirk Wolansky
Also filed as: WOLANSKY DIRK
4 granted patents·4 citations·filing 1999–2017
60Inventor score
Files withIHP GMBH2IHP GMBH—INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS/LEIBNIZ INST FUR INNOVATIVE MIKROE1INST HALBLEITERPHYSIK FRANFURT1
Top patents by PatentIndex Score
4 records- 0158US10832953B2Technological method for preventing, by means of buried etch stop layers, the creation of vertical/lateral inhomogeneities when etching through-silicon viasIHP GMBH—INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS/LEIBNIZ INST FUR INNOVATIVE MIKROE·Filed 2017·Granted Nov 10, 2020·1 cites·12 claims
- 0233US7595534B2Layers in substrate wafersIHP GMBH·Filed 2001·Granted Sep 29, 2009·0 cites·10 claims
- 0325US7244667B2Method and device for the production of thin epitaxial semiconductor layersIHP GMBH·Filed 2002·Granted Jul 17, 2007·0 cites·20 claims
- 0425US6465318B1Bipolar transistor and method for producing sameINST HALBLEITERPHYSIK FRANFURT·Filed 1999·Granted Oct 15, 2002·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →