Inventor · disambiguated record
Dmitriy Yeremin
Also filed as: YEREMIN DMITRIY
10 granted patents·3 pending applications·62 citations·filing 2000–2006
87Inventor score
Top patents by PatentIndex Score
13 records- 0171US6909791B2Method of measuring a line edge roughness of micro objects in scanning microscopesGEN PHOSPHORIX LLC·Filed 2002·Granted Jun 21, 2005·19 cites·10 claims
- 0268US6661007B1Method of diagnosing magnification, linearity and stability of scanning electron microscopeGEN PHOSPHORIX LLC·Filed 2000·Granted Dec 9, 2003·8 cites·6 claims
- 0362US6596993B1Method of automatically correcting magnification and non-linearity of scanning electron microscopeGEN PHOSPHORIX LLC·Filed 2000·Granted Jul 22, 2003·5 cites·7 claims
- 0461US6664532B2Method of precision calibration of magnification of scanning microscopes with the use of test diffraction gratingGEN PHOSPHORIX LLC·Filed 2001·Granted Dec 16, 2003·5 cites·4 claims
- 0559US6686587B2Method of precision calibration of magnification of a scanning microscopes with the use of test diffraction gratingGEN PHOSPHORIX LLC·Filed 2001·Granted Feb 3, 2004·7 cites·4 claims
- 0659US6608294B2Simple method of precision calibration of magnification of a scanning microscopes with the use of test diffraction gratingGEN PHOSPHORIX LLC·Filed 2001·Granted Aug 19, 2003·7 cites·5 claims
- 0754US6573500B2Method of precision calibration of magnification of a scanning microscope with the use of test diffraction gratingGEN PHOSPHORIX LLC·Filed 2001·Granted Jun 3, 2003·5 cites·3 claims
- 0852US7054000B2Method of calibration of magnification of microscopes having different operational principles for bringing them into a single, absolute scaleGEN PHOSPHORIX LLC·Filed 2003·Granted May 30, 2006·6 cites·9 claims
- 0939US6969852B2Method of evaluating of a scanning electron microscope for precise measurementsGEN PHOSHONIX LLC·Filed 2004·Granted Nov 29, 2005·0 cites·6 claims
- 1038US2007081742A1Method of measuring an area of micro-objects of arbitrary shape in scanning electron microscopeYEREMIN DMITRIY·Filed 2005·Application pending·0 cites
- 1137US6982138B2Method of controlling removal of photoresist in openings of a photoresist maskGEN PHOSPHORIX LLC·Filed 2003·Granted Jan 3, 2006·0 cites·9 claims
- 1237US2008114561A1Method of determining micro- and nano- sizes in scanning electron microscopeYEREMIN DMITRIY·Filed 2006·Application pending·0 cites
- 1333US2002164086A1Method of quantitative determination of an image drift in digital imaging microscopeFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →