Inventor · disambiguated record
Do-Hoon Byun
Also filed as: BYUN DO-HOON
5 granted patents·3 pending applications·63 citations·filing 2002–2022
75Inventor score
Top patents by PatentIndex Score
8 records- 0183US6753693B2Test apparatuses for semiconductor integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 22, 2004·44 cites·17 claims
- 0267US6943576B2Systems for testing a plurality of circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·17 cites·14 claims
- 0353US12352813B2Integrated circuit and an electronic device including integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 8, 2025·0 cites·16 claims
- 0453US9754678B2Method of programming one-time programmable (OTP) memory device and method of testing semiconductor integrated circuit including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 5, 2017·2 cites·20 claims
- 0544US12248018B2Semiconductor chip and test method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 11, 2025·0 cites·17 claims
- 0633US2006126248A1Method and apparatus for controlling device power supply in semiconductor testerSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 0733US2007061659A1Methods for testing a plurality of semiconductor devices in parallel and related apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0832US2008068036A1Semiconductor test system capable of virtual test and semiconductor test method thereofYUN BYONG-HUI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →