Inventor · disambiguated record
Dominic Czempas
Also filed as: CZEMPAS DOMINIC
1 granted patent·2 pending applications·0 citations·filing 2015–2025
3Inventor score
Top patents by PatentIndex Score
3 records- 0139US2025321090A1Measuring system and method for characterizing a multilayer structure with layer-by-layer different ohmic properties, sensor module for a measuring system, manufacturing system for a multilayer structure with layer-by-layer different ohmic propertiesNAMISENS GmbH·Filed 2025·Application pending·0 cites
- 0227US11018911B2Apparatus for measuring a physical parameter and method of operating such apparatusHELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK·Filed 2019·Granted May 25, 2021·0 cites·18 claims
- 0316US2017219386A1Sensor system and method for the capacitive detection of obstaclesWIEST THOMAS·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →