Inventor · disambiguated record
Donald E. Edenfeld
Also filed as: EDENFELD DONALD E
3 granted patents·2 citations·filing 2000–2019
50Inventor score
Technology areasG01R
Files withINTEL CORP3
Top patents by PatentIndex Score
3 records- 0149US11112430B2Probe head and electronic device testing systemINTEL CORP·Filed 2019·Granted Sep 7, 2021·0 cites·20 claims
- 0243US10578647B2Probes for wafer sortingINTEL CORP·Filed 2017·Granted Mar 3, 2020·0 cites·14 claims
- 0340US6768297B2High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysisINTEL CORP·Filed 2000·Granted Jul 27, 2004·2 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →