Inventor · disambiguated record
Dominik Ehberger
Also filed as: EHBERGER DOMINIK · EHBERGER DOMINIK PATRICK
6 granted patents·1 pending application·1 citations·filing 2021–2023
65Inventor score
Top patents by PatentIndex Score
7 records- 0182US11545338B2Charged particle beam apparatus and method of controlling sample chargeICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Jan 3, 2023·1 cites·16 claims
- 0263US12451322B2Method of forming a multipole device, method of influencing an electron beam, and multipole deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Granted Oct 21, 2025·0 cites·13 claims
- 0363US12386164B2Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Granted Aug 12, 2025·0 cites·20 claims
- 0460US11791128B2Method of determining the beam convergence of a focused charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Oct 17, 2023·0 cites·20 claims
- 0557US2025037965A1Method of determining a beam convergence of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Application pending·0 cites
- 0656US11810753B2Methods of determining aberrations of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 7, 2023·0 cites·21 claims
- 0751US12308203B2Methods of determining aberrations of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Granted May 20, 2025·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →