Inventor · disambiguated record
Doron Girmonsky
Also filed as: GIRMONSKY DORON
11 granted patents·7 pending applications·111 citations·filing 2004–2024
89Inventor score
Top patents by PatentIndex Score
18 records- 0191US10007862B2System and method for suspect searchQOGNIFY LTD·Filed 2016·Granted Jun 26, 2018·17 cites·15 claims
- 0288US9471849B2System and method for suspect searchNICE-SYSTEMS LTD·Filed 2013·Granted Oct 18, 2016·20 cites·19 claims
- 0384US11423529B2Determination of defect location for examination of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Aug 23, 2022·2 cites·20 claims
- 0482US12480898B2Z-profiling of wafers based on X-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Nov 25, 2025·1 cites·20 claims
- 0582US8948565B2Method and system for utilizing storage in network video recordersNICE SYSTEMS LTD·Filed 2013·Granted Feb 3, 2015·6 cites·8 claims
- 0682US8548297B2Method and system for utilizing storage in network video recordersPASHKEVICH SERGEY·Filed 2012·Granted Oct 1, 2013·11 cites·11 claims
- 0773US8234682B2System and method for central management of network and storage resources for a video surveillance systemDVIR IGAL·Filed 2008·Granted Jul 31, 2012·6 cites·24 claims
- 0863US11301983B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 0962US7134341B2Methods and devices for determining the resonance frequency of passive mechanical resonatorsZULI HOLDINGS LTD·Filed 2004·Granted Nov 14, 2006·48 cites·112 claims
- 1062US2025216347A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1162US2025231132A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1261US2025130185A1Non-destructive three-dimensional probing and characterization of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1358US2024255449A1Non-destructive classification of specimens based on energy signature measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1456US2024096591A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1554US2024085351A1Depth-profiling of samples based on x-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1654US2024094150A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Application pending·0 cites
- 1753US10748272B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·0 cites·20 claims
- 1846US10504693B2Evaluating an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Dec 10, 2019·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →