Inventor · disambiguated record
Doug Gotthard
Also filed as: GOTTHARD DOUG
10 granted patents·179 citations·filing 2001–2022
90Inventor score
Top patents by PatentIndex Score
10 records- 0196US8242448B2Dynamic power control, beam alignment and focus for nanoscale spectroscopyPRATER CRAIG·Filed 2010·Granted Aug 14, 2012·25 cites·23 claims
- 0293US8177422B2Transition temperature microscopyKJOLLER KEVIN·Filed 2008·Granted May 15, 2012·34 cites·18 claims
- 0389US8914911B2Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopyUNIV ILLINOIS·Filed 2013·Granted Dec 16, 2014·10 cites·26 claims
- 0482US7387035B2Method of making a force curve measurement on a sampleVEECO INSTR INC·Filed 2006·Granted Jun 17, 2008·7 cites·11 claims
- 0580US7478552B2Optical detection alignment/tracking method and apparatusVEECO INSTR INC·Filed 2006·Granted Jan 20, 2009·22 cites·21 claims
- 0678US6677697B2Force scanning probe microscopeVEECO INSTR INC·Filed 2001·Granted Jan 13, 2004·23 cites·26 claims
- 0777US7044007B2Force scanning probe microscopeVEECO INSTR INC·Filed 2004·Granted May 16, 2006·32 cites·21 claims
- 0875US7013717B1Manual control with force-feedback for probe microscopy-based force spectroscopyVEECO INSTR INC·Filed 2001·Granted Mar 21, 2006·25 cites·19 claims
- 0973US11813636B2Devices, systems, and methods for reducing microbial load during product coatingAPEEL TECH INC·Filed 2022·Granted Nov 14, 2023·0 cites·16 claims
- 1057US10557789B2Nanoscale infrared spectroscopy with multi-frequency atomic force microscopyBRUKER NANO INC·Filed 2013·Granted Feb 11, 2020·1 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →