Inventor · disambiguated record
Dong-Hyun Han
Also filed as: HAN DONG · HAN DONG HYUN
11 granted patents·5 pending applications·43 citations·filing 2006–2024
86Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7HAN DONG-HYUN5UNIV YONSEI IACF2CXMT CORP1KUNSHAN GOVISIONOX OPTOELECTRONICS CO LTD1
Top patents by PatentIndex Score
16 records- 0186US10789473B2Method and device for providing augmented reality serviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 29, 2020·13 cites·17 claims
- 0282US8274080B2Semiconductor wafer including guard ring patterns and process monitoring patternsHAN DONG-HYUN·Filed 2009·Granted Sep 25, 2012·13 cites·13 claims
- 0377US7846619B2Hybrid photomask and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 7, 2010·6 cites·7 claims
- 0475US8258574B2Semiconductor decoupling capacitor deviceHAN DONG-HYUN·Filed 2010·Granted Sep 4, 2012·5 cites·15 claims
- 0571US7573142B2Alignment key structure in a semiconductor device and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 11, 2009·5 cites·34 claims
- 0661US8673659B2Method of fabricating semiconductor device including process monitoring pattern having overlapping input/output pad array areaHAN DONG-HYUN·Filed 2013·Granted Mar 18, 2014·1 cites·10 claims
- 0752US2025095714A1Word line driver and memory apparatusCXMT CORP·Filed 2024·Application pending·0 cites
- 0848US8183598B2Semiconductor device, semiconductor module, and electronic apparatus including process monitoring pattern overlapping with I/O padHAN DONG-HYUN·Filed 2009·Granted May 22, 2012·0 cites·16 claims
- 0947US2010118311A1Method of detecting an abnormal semiconductor device using a standard optical critical dimension databaseSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1046US8445907B2Semiconductor device including process monitoring pattern having overlapping input/output pad array areaHAN DONG-HYUN·Filed 2010·Granted May 21, 2013·0 cites·10 claims
- 1143US11439050B2Mark recognition devices, mark recognition methods and pseudo pressure alignment devicesKUNSHAN GOVISIONOX OPTOELECTRONICS CO LTD·Filed 2019·Granted Sep 6, 2022·0 cites·14 claims
- 1243US11315657B2Stacked memory apparatus using error correction code and repairing method thereofUNIV YONSEI IACF·Filed 2020·Granted Apr 26, 2022·0 cites·8 claims
- 1340US2007023813A1Semiconductor device having upper electrode and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1440US2007059610A1Method of making and designing dummy patterns for semiconductor devices and semiconductor devices having dummy patternsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1539US2015011074A1Methods of fabricating semiconductor devices having wrapping layerSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1638US10395755B2Stacked memory device using base die spare cell and method of repairing the sameUNIV YONSEI IACF·Filed 2018·Granted Aug 27, 2019·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →