Inventor · disambiguated record
Dong-Seck Lee
Also filed as: LEE DONG-SECK
2 granted patents·19 citations·filing 1996–1996
59Inventor score
Technology areasG01R
Files withHYUNDAI ELECTRONICS IND2
Top patents by PatentIndex Score
2 records- 0134US5675261AProbe card locking device of a probe station for testing a semiconductor waferHYUNDAI ELECTRONICS IND·Filed 1996·Granted Oct 7, 1997·10 cites·3 claims
- 0232US5644246AProbe card locking device of a semiconductor wafer probe stationHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jul 1, 1997·9 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →