Inventor · disambiguated record
Don-Woo Lee
Also filed as: LEE DON-HEE · LEE DON-WOO
11 granted patents·1 pending application·62 citations·filing 1998–2011
88Inventor score
Top patents by PatentIndex Score
12 records- 0180US8648637B2Slew rate boost circuit, output buffer having the same, and method thereofKIM MIN-SUNG·Filed 2011·Granted Feb 11, 2014·4 cites·33 claims
- 0264US6060927AHigh-speed D flip-flopLG SEMICON CO LTD·Filed 1998·Granted May 9, 2000·20 cites·20 claims
- 0363US6800525B2Method of manufacturing split gate flash memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 5, 2004·10 cites·13 claims
- 0463US6392475B1Offset compensation apparatus in a differential amplifier circuit and offset compensation method thereofHYUNDAI ELECTRONICS IND·Filed 2001·Granted May 21, 2002·13 cites·19 claims
- 0562US7544991B2Non-volatile memory device and methods of manufacturing and operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 9, 2009·2 cites·11 claims
- 0656US6974748B2Semiconductor device with split gate electrode structure and method for manufacturing the semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Dec 13, 2005·5 cites·10 claims
- 0753US7205194B2Method of fabricating a flash memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Apr 17, 2007·6 cites·20 claims
- 0848US7375391B2Semiconductor device with split gate electrode structure and method for manufacturing the semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 20, 2008·0 cites·18 claims
- 0948US7195933B2Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring patternSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 27, 2007·0 cites·22 claims
- 1043US7081380B2Method of forming a conductive pattern of a semiconductor device and method of manufacturing a non-volatile semiconductor memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 25, 2006·2 cites·20 claims
- 1143US6924505B2Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring patternSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 2, 2005·0 cites·18 claims
- 1241US2002136664A1Absolute humidity sensorFiled 2000·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Don-Woo Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →