Inventor · disambiguated record
Don Lin
Also filed as: LIN DON · LIN DON L
11 granted patents·2 pending applications·172 citations·filing 1997–2017
90Inventor score
Files withTEST RESEARCH INC5BEHAVIOR TECH COMPUTER CORP3LUCENT TECHNOLOGIES INC3AVAYA TECHNOLOGY CORP1WEN KUANG-PU1
Top patents by PatentIndex Score
13 records- 0185US9019351B2Three-dimensional image measuring apparatusTEST RESEARCH INC·Filed 2012·Granted Apr 28, 2015·9 cites·15 claims
- 0280US5923160AElectrostatic discharge event locatorsLUCENT TECHNOLOGIES INC·Filed 1997·Granted Jul 13, 1999·47 cites·8 claims
- 0373US5954599AAutomated sport boundary officiating systemLUCENT TECHNOLOGIES INC·Filed 1998·Granted Sep 21, 1999·48 cites·28 claims
- 0467US10841561B2Apparatus and method for three-dimensional inspectionTEST RESEARCH INC·Filed 2017·Granted Nov 17, 2020·2 cites·5 claims
- 0562US9420235B2Measuring system for a 3D objectWEN KUANG-PU·Filed 2010·Granted Aug 16, 2016·2 cites·16 claims
- 0660US9423246B2Three-dimensional measurement systemTEST RESEARCH INC·Filed 2013·Granted Aug 23, 2016·2 cites·8 claims
- 0753US5966307ALaser marker control systemBEHAVIOR TECH COMPUTER CORP·Filed 1997·Granted Oct 12, 1999·22 cites·5 claims
- 0851US5867506ACD-ROM testing systemBEHAVIOR TECH COMPUTER CORP·Filed 1997·Granted Feb 2, 1999·11 cites·2 claims
- 0947US5831856ADRAM testing apparatusBEHAVIOR TECH COMPUTER CORP·Filed 1997·Granted Nov 3, 1998·12 cites·17 claims
- 1044US2004150714A1Optical-enhanced apparatus and method for illuminating printed circuit boards for inspectionTEST RESEARCH INC·Filed 2003·Application pending·0 cites
- 1141US2013278723A1Three-dimensional measurement system and three-dimensional measurement methodTEST RESEARCH INC·Filed 2013·Application pending·0 cites
- 1240US6447316B1Method to eliminate or reduce ESD on connectorsAVAYA TECHNOLOGY CORP·Filed 1999·Granted Sep 10, 2002·10 cites·16 claims
- 1337US6175238B1Binary electrostatic discharge locatorLUCENT TECHNOLOGIES INC·Filed 1999·Granted Jan 16, 2001·7 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →