Inventor · disambiguated record
Dong-Uhn Shin
Also filed as: SHIN DONG-UHN
2 granted patents·2 citations·filing 2016–2018
35Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0177US10802048B2Universal test socket, semiconductor test device, and method of testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Oct 13, 2020·2 cites·19 claims
- 0245US10470315B2Manufacturing method of test socket and test method for semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 5, 2019·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →