Inventor · disambiguated record
Douglas J. Thomson
Also filed as: THOMSON DOUGLAS · THOMSON DOUGLAS J · THOMSON DOUGLAS JOHN
9 granted patents·3 pending applications·149 citations·filing 1992–2020
88Inventor score
Top patents by PatentIndex Score
12 records- 0180US5332973ABuilt-in fault testing of integrated circuitsUNIV MANITOBA·Filed 1992·Granted Jul 26, 1994·51 cites·15 claims
- 0274US7441463B2Sensing system based on multiple resonant electromagnetic cavitiesUNIV MANITOBA·Filed 2006·Granted Oct 28, 2008·8 cites·36 claims
- 0372US7347101B2Measuring strain in a structure using a sensor having an electromagnetic resonatorUNIV MANITOBA·Filed 2003·Granted Mar 25, 2008·18 cites·31 claims
- 0467US6298715B1Scanning force microscope probe cantilever with reflective structureMFI TECHNOLOGIES CORP·Filed 1999·Granted Oct 9, 2001·37 cites·23 claims
- 0557US5402236AFiberoptic displacement sensor using interferometric techniquesIDERS INC·Filed 1993·Granted Mar 28, 1995·20 cites·8 claims
- 0649US11513056B2Parallel single cell lens free optical dielectrophoresis cytometerUNIV MANITOBA·Filed 2020·Granted Nov 29, 2022·0 cites·14 claims
- 0748US2010253417A1Conducting Polymer for Electronic, Photonic and Electromechanical SystemsUNIV MANITOBA·Filed 2008·Application pending·0 cites
- 0841US2015090592A1Split-sensor dielectrophoretic/magnetophoretic cytometerUNIV MANITOBA·Filed 2014·Application pending·0 cites
- 0935US2010301321A1Tunable DiodeUNIV MANITOBA·Filed 2010·Application pending·0 cites
- 1034US6377066B1Method and apparatus for sub-micron imaging and probing on probe stationMFI TECHNOLOGIES CORP·Filed 2000·Granted Apr 23, 2002·3 cites·33 claims
- 1134US5959447ANon-contact measurement of electrical waveforms on the surface of a sample using time domain gatingMICRON FORCE INSTR INC·Filed 1998·Granted Sep 28, 1999·12 cites·38 claims
- 1231US10281511B2Passive wireless sensor for the measurement of AC electric field in the vicinity of high voltage apparatusUNIV MANITOBA·Filed 2015·Granted May 7, 2019·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →