Inventor · disambiguated record
Donald A. Tiffin
Also filed as: TIFFIN DONALD A
4 granted patents·322 citations·filing 1994–1997
83Inventor score
Files withADVANCED MICRO DEVICES INC4
Top patents by PatentIndex Score
4 records- 0191US5742658AApparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor waferADVANCED MICRO DEVICES INC·Filed 1996·Granted Apr 21, 1998·143 cites·28 claims
- 0280US5520769AMethod for measuring concentration of dopant within a semiconductor substrateADVANCED MICRO DEVICES INC·Filed 1994·Granted May 28, 1996·86 cites·20 claims
- 0377US5754620AApparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor waferADVANCED MICRO DEVICES INC·Filed 1996·Granted May 19, 1998·51 cites·29 claims
- 0472US6005915AApparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photonsADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 21, 1999·42 cites·24 claims
Join the waitlist — get patent alerts
Get an alert when Donald A. Tiffin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →