Inventor · disambiguated record
Dong Hyun Yo
Also filed as: YO DONG HYUN
11 granted patents·76 citations·filing 2006–2013
88Inventor score
Top patents by PatentIndex Score
11 records- 0192US7954869B2Pick and place apparatusTECHWING CO LTD·Filed 2006·Granted Jun 7, 2011·23 cites·18 claims
- 0289US8141922B2Pick-and-place apparatusSHIM JAE-GYUN·Filed 2007·Granted Mar 27, 2012·17 cites·6 claims
- 0387US8496426B2Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading elementNA YUN-SUNG·Filed 2010·Granted Jul 30, 2013·8 cites·5 claims
- 0487US8038191B2Pick and place apparatusTECHWING CO LTD·Filed 2008·Granted Oct 18, 2011·13 cites·9 claims
- 0577US8154314B2Side-docking type test handler and apparatus for transferring test tray for sameSHIM JAE GYUN·Filed 2009·Granted Apr 10, 2012·7 cites·5 claims
- 0667US8146969B2Pick-and-place module for test handlersYO DONG HYUN·Filed 2010·Granted Apr 3, 2012·3 cites·3 claims
- 0766US7741836B2Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handlerTECHWING CO LTD·Filed 2008·Granted Jun 22, 2010·3 cites·7 claims
- 0859US8570058B2Carrier board transfer system for handler that supports testing of electronic devices and method for transferring carrier board in chamber of handlerNA YUN-SUNG·Filed 2009·Granted Oct 29, 2013·2 cites·8 claims
- 0951US8926259B2Pick and place apparatus for electronic device inspection equipmentTECHWING CO LTD·Filed 2013·Granted Jan 6, 2015·0 cites·1 claims
- 1047US7876117B2Operating method of test handlerTECHWING CO LTD·Filed 2010·Granted Jan 25, 2011·0 cites·5 claims
- 1145US7696745B2Operating method of test handlerTECHWING CO LTD·Filed 2008·Granted Apr 13, 2010·0 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Dong Hyun Yo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →