Inventor · disambiguated record
Duane Donald Wendling
Also filed as: WENDLING DUANE D · WENDLING DUANE DONALD
2 granted patents·43 citations·filing 1998–1999
61Inventor score
Top patents by PatentIndex Score
2 records- 0172US6437868B1In-situ automated contactless thickness measurement for wafer thinningAGERE SYST GUARDIAN CORP·Filed 1999·Granted Aug 20, 2002·39 cites·30 claims
- 0231US6210546B1Fixture with at least one trough and method of using the fixture in a plasma or ion beamLUCENT TECHNOLOGIES INC·Filed 1998·Granted Apr 3, 2001·4 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →