Inventor · disambiguated record
Duck-Sun Yang
Also filed as: YANG DUCK-SUN
1 granted patent·2 pending applications·3 citations·filing 2004–2006
22Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
3 records- 0152US7245365B2Apparatus and method for detecting particles on an objectSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 17, 2007·3 cites·38 claims
- 0241US2005111004A1Specimen inspection apparatus and reference value setting unit and method of the specimen inspection apparatusFiled 2004·Application pending·0 cites
- 0339US2007064232A1Method and system for measuring overlay of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →