Inventor · disambiguated record
Dwayne Burek
Also filed as: BUREK DWAYNE · BUREK DWAYNE M
7 granted patents·446 citations·filing 1992–2004
89Inventor score
Top patents by PatentIndex Score
7 records- 0196US5349587AMultiple clock rate test apparatus for testing digital systemsNORTHERN TELECOM LTD·Filed 1992·Granted Sep 20, 1994·201 cites·19 claims
- 0294US6510534B1Method and apparatus for testing high performance circuitsLOGICVISION INC·Filed 2000·Granted Jan 21, 2003·82 cites·44 claims
- 0386US6615392B1Hierarchical design and test method and system, program product embodying the method and integrated circuit produced therebyLOGICVISION INC·Filed 2000·Granted Sep 2, 2003·44 cites·75 claims
- 0485US7203873B1Asynchronous control of memory self testMAGMA DESIGN AUTOMATION INC·Filed 2004·Granted Apr 10, 2007·46 cites·22 claims
- 0577US6145105AMethod and apparatus for scan testing digital circuitsLOGICVISION INC·Filed 1998·Granted Nov 7, 2000·42 cites·28 claims
- 0674US6457161B1Method and program product for modeling circuits with latch based designFiled 2001·Granted Sep 24, 2002·22 cites·25 claims
- 0760US6862717B2Method and program product for designing hierarchical circuit for quiescent current testingLOGICVISION INC·Filed 2001·Granted Mar 1, 2005·9 cites·79 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →