Inventor · disambiguated record
Dwight A. Sehler
Also filed as: SANDBERG LEGAL REPRESENTATIVE KAREN R · SEHLER DWIGHT · SEHLER DWIGHT A
12 granted patents·4 pending applications·571 citations·filing 2002–2025
94Inventor score
Technology areasG01N
Top patents by PatentIndex Score
16 records- 0198US8027035B2Non-orthogonal particle detection systems and methodsPARTICLE MEASURING SYST·Filed 2011·Granted Sep 27, 2011·55 cites·21 claims
- 0297US11946852B2Particle detection systems and methods for on-axis particle detection and/or differential detectionPARTICLE MEASURING SYST·Filed 2021·Granted Apr 2, 2024·6 cites·20 claims
- 0397US11237095B2Particle detection systems and methods for on-axis particle detection and/or differential detectionPARTICLE MEASURING SYST·Filed 2020·Granted Feb 1, 2022·18 cites·24 claims
- 0497US8427642B2Two-dimensional optical imaging methods and systems for particle detectionMITCHELL JOHN·Filed 2012·Granted Apr 23, 2013·70 cites·28 claims
- 0597US7916293B2Non-orthogonal particle detection systems and methodsPARTICLE MEASURING SYST·Filed 2008·Granted Mar 29, 2011·67 cites·38 claims
- 0697US7456960B2Particle counter with improved image sensor arrayPARTICLE MEASURING SYST·Filed 2005·Granted Nov 25, 2008·65 cites·48 claims
- 0796US8174697B2Non-orthogonal particle detection systems and methodsMITCHELL JOHN·Filed 2011·Granted May 8, 2012·48 cites·20 claims
- 0896US8154724B2Two-dimensional optical imaging methods and systems for particle detectionMITCHELL JOHN·Filed 2008·Granted Apr 10, 2012·75 cites·34 claims
- 0993US7030980B1Diode pumped intracavity laser particle counter with improved reliability and reduced noisePARTICLE MEASURING SYST·Filed 2004·Granted Apr 18, 2006·69 cites·18 claims
- 1093US6903818B2Low noise intracavity laser particle counterPARTICLE MEASURING SYST·Filed 2002·Granted Jun 7, 2005·94 cites·28 claims
- 1191US11988593B2Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensionsPARTICLE MEASURING SYST·Filed 2020·Granted May 21, 2024·4 cites·27 claims
- 1277US12326393B2Enhanced dual-pass and multi-pass particle detectionPARTICLE MEASURING SYST·Filed 2023·Granted Jun 10, 2025·0 cites·23 claims
- 1375US2025334502A1Enhanced dual-pass and multi-pass particle detectionPARTICLE MEASURING SYST·Filed 2025·Application pending·0 cites
- 1474US2024230509A9Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensionsPARTICLE MEASURING SYST·Filed 2023·Application pending·0 cites
- 1561US2023087059A1Optical isolator stabilized laser optical particle detector systems and methodsPARTICLE MEASURING SYST·Filed 2022·Application pending·0 cites
- 1657US2009190128A1Particle Counter With Improved Image Sensor ArrayPARTICLE MEASURING SYST·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Dwight A. Sehler files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →