Inventor · disambiguated record
Edin Andelic
Also filed as: ANDELIC EDIN
6 granted patents·4 pending applications·2 citations·filing 2009–2019
66Inventor score
Files withANDELIC EDIN3KROHNE MESSTECHNIK GMBH2ALBER THOMAS1APTIV TECH LTD1CONDUCTA ENDRESS & HAUSER1
Top patents by PatentIndex Score
10 records- 0158US8576399B2Method and apparatus for turbidity measurementANDELIC EDIN·Filed 2009·Granted Nov 5, 2013·2 cites·20 claims
- 0246US10922827B2Distance estimation of vehicle headlightsAPTIV TECH LTD·Filed 2019·Granted Feb 16, 2021·0 cites·20 claims
- 0344US10161867B2Method and measuring device for determining a property of a mediumKROHNE MESSTECHNIK GMBH·Filed 2017·Granted Dec 25, 2018·0 cites·10 claims
- 0440US9651479B2Method and analyzer for determining a measured value of a measured variable of process automation technologyENDRESS + HAUSER CONDUCTA GES FÜR MESS- UND REGELTECHNIK MBH + CO KG·Filed 2015·Granted May 16, 2017·0 cites·14 claims
- 0539US2014046612A1Method for calibrating a sensor for turbidity measurementCONDUCTA ENDRESS & HAUSER·Filed 2013·Application pending·0 cites
- 0638US10627472B2Method for operating an inductive conductivity sensor and respective inductive conductivity sensorKROHNE MESSTECHNIK GMBH·Filed 2017·Granted Apr 21, 2020·0 cites·10 claims
- 0735US2013103357A1Method for recognizing and/or assessment of device and/or process related disturbances in a measurement signalMESS UND REGELTECHNIK MBH & CO KG ENDRESS & HAUSER CONDUCTA GES FUR·Filed 2012·Application pending·0 cites
- 0834US8543348B2Method and arrangement for automatic calibrating of spectrometersALBER THOMAS·Filed 2009·Granted Sep 24, 2013·0 cites·13 claims
- 0930US2012022794A1Turbidity Measuring DeviceANDELIC EDIN·Filed 2010·Application pending·0 cites
- 1027US2012162645A1Method for determining a measured variable of a medium, especially for turbidity measurementANDELIC EDIN·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Edin Andelic files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →