Inventor · disambiguated record

Edmond Cheng

Also filed as: CHENG EDMOND

1 granted patent·30 citations·filing 2005–2005

44Inventor score

Technology areasG01R

Files withFREESCALE SEMICONDUCTOR INC1

Top patents by PatentIndex Score

1 record

0189US7262615B2Method and apparatus for testing a semiconductor structure having top-side and bottom-side connectionsFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Aug 28, 2007·30 cites·20 claims

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