Inventor · disambiguated record
Edward I. Cole, Jr.
Also filed as: COLE EDWARD I · COLE JR EDWARD I
16 granted patents·967 citations·filing 1994–2018
95Inventor score
Files withSANDIA CORP8NAT TECH & ENG SOLUTIONS SANDIA LLC2ADVANCED MICRO DEVICES INC1NATIONAL TECH AND ENGINEERING SOLUTIONS OF SANDIA LLC1TANGYUNYONG PAIBOON1
Top patents by PatentIndex Score
16 records- 0197US6549022B1Apparatus and method for analyzing functional failures in integrated circuitsSANDIA CORP·Filed 2000·Granted Apr 15, 2003·187 cites·55 claims
- 0297US6078183AThermally-induced voltage alteration for integrated circuit analysisSANDIA CORP·Filed 1998·Granted Jun 20, 2000·173 cites·40 claims
- 0395US10094874B1Scanning method for screening of electronic devicesSANDIA CORP·Filed 2016·Granted Oct 9, 2018·15 cites·20 claims
- 0495US5523694AIntegrated circuit failure analysis by low-energy charge-induced voltage alterationFiled 1994·Granted Jun 4, 1996·141 cites·24 claims
- 0594US6407560B1Thermally-induced voltage alteration for analysis of microelectromechanical devicesSANDIA CORP·Filed 2000·Granted Jun 18, 2002·128 cites·50 claims
- 0693US10145894B1Defect screening method for electronic circuits and circuit components using power spectrum anaylysisNAT TECH & ENG SOLUTIONS SANDIA LLC·Filed 2015·Granted Dec 4, 2018·9 cites·18 claims
- 0792US5430305ALight-induced voltage alteration for integrated circuit analysisUS ARMY·Filed 1994·Granted Jul 4, 1995·106 cites·25 claims
- 0891US9599667B1Visible light laser voltage probing on thinned substratesSANDIA CORP·Filed 2015·Granted Mar 21, 2017·13 cites·20 claims
- 0988US10060973B1Test circuits for integrated circuit counterfeit detectionNATIONAL TECH AND ENGINEERING SOLUTIONS OF SANDIA LLC·Filed 2015·Granted Aug 28, 2018·7 cites·15 claims
- 1086US5781017ACapacitive charge generation apparatus and method for testing circuitsSANDIA CORP·Filed 1996·Granted Jul 14, 1998·69 cites·28 claims
- 1182US7525325B1System and method for floating-substrate passive voltage contrastSANDIA CORP·Filed 2006·Granted Apr 28, 2009·16 cites·28 claims
- 1281US5465046AMagnetic force microscopy method and apparatus to detect and image currents in integrated circuitsFiled 1994·Granted Nov 7, 1995·58 cites·29 claims
- 1380US9188622B1Power spectrum analysis for defect screening in integrated circuit devicesTANGYUNYONG PAIBOON·Filed 2011·Granted Nov 17, 2015·6 cites·18 claims
- 1466US6031386AApparatus and method for defect testing of integrated circuitsSANDIA CORP·Filed 1997·Granted Feb 29, 2000·28 cites·45 claims
- 1564US6546513B1Data processing device test apparatus and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 8, 2003·11 cites·26 claims
- 1661US10254334B2Test circuits for integrated circuit counterfeit detectionNAT TECH & ENG SOLUTIONS SANDIA LLC·Filed 2018·Granted Apr 9, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →