Inventor · disambiguated record
Eddy C. Huang
Also filed as: HUANG EDDY · HUANG EDDY C · HUANG EDDY CHIEH
35 granted patents·3 pending applications·2,091 citations·filing 1984–2008
98Inventor score
Top patents by PatentIndex Score
38 records- 0199US7126856B2Method and apparatus of memory clearing with monitoring RAM memory cells in a field programmable gated arrayACTEL CORP·Filed 2005·Granted Oct 24, 2006·127 cites·12 claims
- 0298US7015719B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2005·Granted Mar 21, 2006·269 cites·3 claims
- 0398US6888375B2Tileable field-programmable gate array architectureACTEL CORP·Filed 2003·Granted May 3, 2005·261 cites·14 claims
- 0498US6476636B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2000·Granted Nov 5, 2002·96 cites·10 claims
- 0597US6731133B1Routing structures for a tileable field-programmable gate array architectureACTEL CORP·Filed 2002·Granted May 4, 2004·133 cites·15 claims
- 0697US6611153B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2002·Granted Aug 26, 2003·69 cites·4 claims
- 0797US6504398B1Integrated circuit that includes a field-programmable gate array and a hard gate array having the same underlying structureACTEL CORP·Filed 2000·Granted Jan 7, 2003·159 cites·18 claims
- 0896US6744278B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2002·Granted Jun 1, 2004·97 cites·3 claims
- 0995US6700404B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2002·Granted Mar 2, 2004·78 cites·10 claims
- 1095US6211697B1Integrated circuit that includes a field-programmable gate array and a hard gate array having the same underlying structureACTEL·Filed 1999·Granted Apr 3, 2001·220 cites·17 claims
- 1195US5121014ACMOS delay circuit with controllable delayVLSI TECHNOLOGY INC·Filed 1991·Granted Jun 9, 1992·93 cites·9 claims
- 1292US7673194B1Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltageACTEL CORP·Filed 2007·Granted Mar 2, 2010·18 cites·21 claims
- 1388US7482835B1Method and apparatus of memory clearing with monitoring RAM memory cells in a field programmable gated arrayACTEL CORP·Filed 2006·Granted Jan 27, 2009·13 cites·13 claims
- 1488US4908528AInput circuit having improved noise immunityVLSI TECHNOLOGY INC·Filed 1988·Granted Mar 13, 1990·39 cites·10 claims
- 1586US6301696B1Final design method of a programmable logic device that is based on an initial design that consists of a partial underlying physical templateACTEL CORP·Filed 1999·Granted Oct 9, 2001·132 cites·20 claims
- 1685US6531891B1Method and apparatus of memory clearing with monitoring memory cellsACTEL CORP·Filed 2002·Granted Mar 11, 2003·15 cites·27 claims
- 1781US6937063B1Method and apparatus of memory clearing with monitoring RAM memory cells in a field programmable gated arrayACTEL CORP·Filed 2004·Granted Aug 30, 2005·17 cites·15 claims
- 1874US6446242B1Method and apparatus for storing a validation number in a field-programmable gate arrayACTEL CORP·Filed 1999·Granted Sep 3, 2002·67 cites·16 claims
- 1973US7310760B1Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltageSUN CHUNG·Filed 2002·Granted Dec 18, 2007·16 cites·13 claims
- 2073US7137095B1Freeway routing system for a gate arrayACTEL CORP·Filed 2002·Granted Nov 14, 2006·9 cites·6 claims
- 2169US6205515B1Column redundancy circuitry with reduced time delayWINBOND ELECTRONIC CORP·Filed 1998·Granted Mar 20, 2001·29 cites·4 claims
- 2268US6098145APulsed Y-decoders for improving bitline precharging in memoriesWINBOND ELECTRONICS CORP·Filed 1998·Granted Aug 1, 2000·28 cites·12 claims
- 2367US7342416B2Tileable field-programmable gate array architectureACTEL CORP·Filed 2006·Granted Mar 11, 2008·4 cites·10 claims
- 2464US7426667B1Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltageACTEL CORP·Filed 2007·Granted Sep 16, 2008·3 cites·3 claims
- 2564US5206545AMethod and apparatus for providing output contention relief for digital buffersVLSI TECHNOLOGY INC·Filed 1991·Granted Apr 27, 1993·17 cites·20 claims
- 2662US7157938B2Tileable field-programmable gate array architectureACTEL CORP·Filed 2006·Granted Jan 2, 2007·3 cites·3 claims
- 2762US6870396B2Tileable field-programmable gate array architectureACTEL CORP·Filed 2003·Granted Mar 22, 2005·10 cites·4 claims
- 2862US5150187AInput protection circuit for cmos devicesVLSI TECHNOLOGY INC·Filed 1991·Granted Sep 22, 1992·22 cites·6 claims
- 2957US4609838AProgrammable array combinatorial (PAC) circuitryVLSI TECHNOLOGY INC·Filed 1984·Granted Sep 2, 1986·9 cites·7 claims
- 3056US5936449ADynamic CMOS register with a self-tracking clockWINBOND ELECTRONICS CORP·Filed 1997·Granted Aug 10, 1999·17 cites·7 claims
- 3153US2007089082A1Freeway routing system for a gate arrayACTEL CORP·Filed 2006·Application pending·0 cites
- 3247US2008238477A1Tileable field-programmable gate array architectureACTEL CORP·Filed 2008·Application pending·0 cites
- 3344US7426665B1Tileable field-programmable gate array architectureACTEL CORP·Filed 2002·Granted Sep 16, 2008·3 cites·13 claims
- 3437US6111813AApparatus and method for tracking dynamic sense amplifier enable signals with memory array accessing signals in a synchronous RAMWINBOND ELECTRONICS CORP·Filed 1997·Granted Aug 29, 2000·5 cites·6 claims
- 3535US5034687ASignature indicating circuitVLSI TECHNOLOGY INC·Filed 1989·Granted Jul 23, 1991·7 cites·18 claims
- 3634US5872467ADynamic comparator with improved pre-charge/set-up timeWINBOND ELECTRONICS CORP·Filed 1997·Granted Feb 16, 1999·6 cites·7 claims
- 3730US5226007AAutomatic shutoff for memory load device during write operationVLSI TECHNOLOGY INC·Filed 1991·Granted Jul 6, 1993·0 cites·19 claims
- 3830US2001015916A1Storage cells utilizing reduced pass gate voltages for read and write operationsFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →