Inventor · disambiguated record
Edward Tsidilkovski
Also filed as: TSIDILKOVSKI EDWARD
2 granted patents·5 pending applications·15 citations·filing 2003–2017
56Inventor score
Top patents by PatentIndex Score
7 records- 0164US7403023B2Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.QC SOLUTIONS INC·Filed 2006·Granted Jul 22, 2008·3 cites·23 claims
- 0263US6911350B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Jun 28, 2005·12 cites·23 claims
- 0339US2008048636A1Method and apparatus for silicon-on-insulator material characterizationQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 0438US2008182347A1Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (SOI) wafer manufacturingQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 0537US2008020549A1Method and apparatus for forming an oxide layer on semiconductorsQC SOLUTIONS INC·Filed 2006·Application pending·0 cites
- 0635US2008036464A1Probes and methods for semiconductor wafer analysisQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 0732US2020321363A1Process and system for measuring morphological characteristics of fiber laser annealed polycrystalline silicon films for flat panel displayIPG PHOTONICS CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →