Inventor · disambiguated record
Eiji Arima
Also filed as: ARIMA EIJI
5 granted patents·0 citations·filing 2018–2021
57Inventor score
Files withHITACHI HIGH TECH CORP5
Top patents by PatentIndex Score
5 records- 0155US12345654B2Defect inspection device, defect inspection method, and adjustment substrateHITACHI HIGH TECH CORP·Filed 2021·Granted Jul 1, 2025·0 cites·8 claims
- 0248US12025569B2Defect inspection device and inspection method, and optical moduleHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 2, 2024·0 cites·15 claims
- 0346US12400889B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Aug 26, 2025·0 cites·11 claims
- 0446US12146840B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 19, 2024·0 cites·15 claims
- 0543US12366538B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 22, 2025·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →