Inventor · disambiguated record
Eishi Kawasaki
Also filed as: KAWASAKI EISHI
13 granted patents·2 pending applications·338 citations·filing 1988–2024
92Inventor score
Top patents by PatentIndex Score
15 records- 0192US7540199B2Physical quantity sensorDENSO CORP·Filed 2007·Granted Jun 2, 2009·23 cites·31 claims
- 0288US6388279B1Semiconductor substrate manufacturing method, semiconductor pressure sensor and manufacturing method thereofDENSO CORP·Filed 1998·Granted May 14, 2002·70 cites·8 claims
- 0387US4930353ASemiconductor pressure sensorNIPPON DENSO CO·Filed 1989·Granted Jun 5, 1990·56 cites·19 claims
- 0486US6450025B1Micro-heater and airflow sensor using the sameDENSO CORP·Filed 2000·Granted Sep 17, 2002·71 cites·22 claims
- 0580US12352707B2Baggage inspection deviceNIPPON SIGNAL CO LTD·Filed 2021·Granted Jul 8, 2025·1 cites·5 claims
- 0679US2025123224A1Baggage Inspection DeviceNIPPON SIGNAL CO LTD·Filed 2024·Application pending·0 cites
- 0777US5825443AColor liquid crystal display with three dichroic mirrors reflecting in different directions to three pixels which reflect to common opticsDENSO CORP·Filed 1997·Granted Oct 20, 1998·68 cites·14 claims
- 0877US2025027888A1Inspection SystemNIPPON SIGNAL CO LTD·Filed 2024·Application pending·0 cites
- 0974US7950288B2Physical quantity sensorDENSO CORP·Filed 2009·Granted May 31, 2011·5 cites·14 claims
- 1066US12140554B2Inspection systemNIPPON SIGNAL CO LTD·Filed 2020·Granted Nov 12, 2024·0 cites·3 claims
- 1165US4881056AFacedown-type semiconductor pressure sensor with spacerNIPPON DENSO CO·Filed 1988·Granted Nov 14, 1989·22 cites·28 claims
- 1264US12044633B2Inspection systemNIPPON SIGNAL CO LTD·Filed 2020·Granted Jul 23, 2024·0 cites·17 claims
- 1364US6933582B2Semiconductor sensor having a diffused resistorDENSO CORP·Filed 2003·Granted Aug 23, 2005·11 cites·12 claims
- 1463US7157781B2Enhancement of membrane characteristics in semiconductor device with membraneDENSO CORP·Filed 2003·Granted Jan 2, 2007·11 cites·4 claims
- 1547US12372483B2System for non-destructively inspecting baggage, method for nondestructively inspecting baggage, program, and recording mediumEYETECH CO LTD·Filed 2020·Granted Jul 29, 2025·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →