Inventor · disambiguated record
Eizo Kawato
Also filed as: KAWATO EIZO
25 granted patents·1 pending application·389 citations·filing 1998–2011
96Inventor score
Files withSHIMADZU CORP17SHIMADZU RES LAB EUROPE LTD5KAWATO EIZO2HABU TOSHIYA1SHIMAZDU RES LAB EUROP LTD1
Top patents by PatentIndex Score
26 records- 0196US8004432B2Time-of-flight measuring deviceSHIMADZU CORP·Filed 2007·Granted Aug 23, 2011·31 cites·10 claims
- 0292US6649911B2Method of selecting ions in an ion storage deviceSHIMADZU CORP·Filed 2002·Granted Nov 18, 2003·43 cites·18 claims
- 0385US7176456B2Ion trap device and its adjusting methodSHIMADZU CORP·Filed 2005·Granted Feb 13, 2007·8 cites·4 claims
- 0485US6087658AIon trapSHIMADZU CORP·Filed 1998·Granted Jul 11, 2000·43 cites·12 claims
- 0584US6384410B1Time-of-flight mass spectrometerSHIMADZU RES LAB EUROPE LTD·Filed 1999·Granted May 7, 2002·42 cites·17 claims
- 0681US6870159B2Ion trap device and its tuning methodSHIMADZU CORP·Filed 2003·Granted Mar 22, 2005·15 cites·8 claims
- 0780US9537422B2High-frequency power supply apparatus for supplying high-frequency powerKAWATO EIZO·Filed 2010·Granted Jan 3, 2017·9 cites·6 claims
- 0879US6960762B2Mass spectroscope and method for analysisSHIMADZU CORP·Filed 2003·Granted Nov 1, 2005·14 cites·8 claims
- 0979US6730903B2Ion trap deviceSHIMADZU CORP·Filed 2002·Granted May 4, 2004·14 cites·6 claims
- 1078US6621078B2Ion trapping deviceSHIMADZU CORP·Filed 2002·Granted Sep 16, 2003·14 cites·8 claims
- 1178US6380666B1Time-of-flight mass spectrometerSHIMADZU RES LAB EUROPE LTD·Filed 1999·Granted Apr 30, 2002·31 cites·17 claims
- 1277US6444980B1Apparatus for production and extraction of charged particlesSHIMAZDU RES LAB EUROP LTD·Filed 1999·Granted Sep 3, 2002·36 cites·29 claims
- 1376US7250600B2Mass spectrometer with an ion trapSHIMADZU CORP·Filed 2004·Granted Jul 31, 2007·11 cites·9 claims
- 1475US6803564B2Time-of-flight mass spectrometerSHIMADZU CORP·Filed 2002·Granted Oct 12, 2004·11 cites·15 claims
- 1573US7501622B2Ion storage deviceSHIMADZU CORP·Filed 2004·Granted Mar 10, 2009·9 cites·5 claims
- 1673US6977374B2Ion trap deviceSHIMADZU CORP·Filed 2004·Granted Dec 20, 2005·9 cites·10 claims
- 1771US7282708B2Method of selecting ions in an ion storage deviceSHIMADZU CORP·Filed 2005·Granted Oct 16, 2007·2 cites·8 claims
- 1871US7256397B2Mass analyzer and mass analyzing methodSHIMADZU CORP·Filed 2003·Granted Aug 14, 2007·8 cites·10 claims
- 1970US7778007B2Optical emission analysis apparatusSHIMADZU CORP·Filed 2007·Granted Aug 17, 2010·2 cites·10 claims
- 2069US7643267B2Optical emission spectrometry deviceSHIMADZU CORP·Filed 2007·Granted Jan 5, 2010·2 cites·10 claims
- 2161US6483244B1Method of fast start and/or fast termination of a radio frequency resonatorSHIMADZU RES LAB EUROPE LTD·Filed 1998·Granted Nov 19, 2002·15 cites·19 claims
- 2256US6576893B1Method of trapping ions in an ion trapping deviceSHIMADZU RES LAB EUROPE LTD·Filed 1999·Granted Jun 10, 2003·12 cites·7 claims
- 2350US6762561B1Radio frequency resonatorSHIMADZU RES LAB EUROPE LTD·Filed 2000·Granted Jul 13, 2004·8 cites·17 claims
- 2445US2006016977A1Time-of-flight analyzerSHIMADZU CORP·Filed 2005·Application pending·0 cites
- 2540US10083826B2Input protection circuit for high-speed analogue signal and time-of-flight mass spectrometerKAWATO EIZO·Filed 2006·Granted Sep 25, 2018·0 cites·4 claims
- 2639US8643838B2Emission spectrophotometerHABU TOSHIYA·Filed 2011·Granted Feb 4, 2014·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →