Inventor · disambiguated record
Eisuke Saneyoshi
Also filed as: SANEYOSHI EISUKE
30 granted patents·7 pending applications·73 citations·filing 2005–2020
94Inventor score
Top patents by PatentIndex Score
37 records- 0195US7605371B2High-resolution high-speed terahertz spectrometerUNIV OSAKA·Filed 2005·Granted Oct 20, 2009·37 cites·7 claims
- 0294US10495674B2Monitoring device, monitoring system, monitoring method, correction information generation device, correction information generation method, and non-transitory storage mediumNEC CORP·Filed 2015·Granted Dec 3, 2019·7 cites·30 claims
- 0382US8674774B2Aging diagnostic device, aging diagnostic methodSANEYOSHI EISUKE·Filed 2010·Granted Mar 18, 2014·6 cites·7 claims
- 0480US11358086B2State estimation apparatus, method, and program storage mediumNEC CORP·Filed 2018·Granted Jun 14, 2022·2 cites·6 claims
- 0579US10056757B2Control device, power storage device, battery control system, battery control device, control method, battery control method, and recording mediumNEC CORP·Filed 2014·Granted Aug 21, 2018·6 cites·40 claims
- 0678US11002773B2Monitoring apparatus, monitoring method, and storage mediumNEC CORP·Filed 2014·Granted May 11, 2021·2 cites·13 claims
- 0778US10181737B2Supply and demand adjustment system, supply and demand adjustment method, and supply and demand adjustment programNEC CORP·Filed 2017·Granted Jan 15, 2019·1 cites·20 claims
- 0877US11501388B2Production management apparatus, method, and non-transitory mediumNEC CORP·Filed 2017·Granted Nov 15, 2022·2 cites·18 claims
- 0970US10274573B2Monitoring system, monitoring device and method of operating the same, server and method of operating the same, and non-transitory storage mediumNEC CORP·Filed 2015·Granted Apr 30, 2019·1 cites·14 claims
- 1069US10365675B2Battery control device, battery control support device, battery control system, battery control method, battery control support method, and recording mediumNEC CORP·Filed 2014·Granted Jul 30, 2019·3 cites·12 claims
- 1168US11263859B2Maintenance monitoring apparatus, system, method, and programNEC CORP·Filed 2017·Granted Mar 1, 2022·1 cites·19 claims
- 1268US11067612B2Monitoring device, monitoring system, monitoring method, correction information generation device, correction information generation method, and non-transitory storage mediumNEC CORP·Filed 2019·Granted Jul 20, 2021·0 cites·6 claims
- 1367US10466283B2Training data generation device, electrical device monitoring system, training data generation method, and non-transitory storage mediumNEC CORP·Filed 2015·Granted Nov 5, 2019·1 cites·10 claims
- 1463US9859735B2Supply and demand adjustment system, supply and demand adjustment method, and supply and demand adjustment programNEC CORP·Filed 2014·Granted Jan 2, 2018·1 cites·14 claims
- 1559US9881270B2Information processing device, power-demanding object, information processing method, and non-transitory storage mediumNEC CORP·Filed 2014·Granted Jan 30, 2018·1 cites·9 claims
- 1656US2022175184A1Processing apparatus, processing method, and non-transitory storage mediumNEC CORP·Filed 2019·Application pending·0 cites
- 1755US10033214B2Power supply-demand adjusting apparatus, power system and power supply-demand adjusting methodNEC CORP·Filed 2014·Granted Jul 24, 2018·1 cites·10 claims
- 1853US10712374B2Data processing device, data processing method, and non-transitory storage mediumNEC CORP·Filed 2016·Granted Jul 14, 2020·0 cites·12 claims
- 1952US11865483B2State estimation apparatus, method, and program recording mediumNEC CORP·Filed 2018·Granted Jan 9, 2024·0 cites·12 claims
- 2052US9912157B2Energy management system and energy management methodNEC CORP·Filed 2013·Granted Mar 6, 2018·0 cites·9 claims
- 2150US12326356B2Vehicle weight estimation apparatus, vehicle weight estimation method, and computer readable recording mediumNEC CORP·Filed 2019·Granted Jun 10, 2025·0 cites·4 claims
- 2250US12070137B2State estimation apparatus, method, and program storage mediumNEC CORP·Filed 2019·Granted Aug 27, 2024·0 cites·9 claims
- 2349US8444316B2Temperature measuring device and methodSANEYOSHI EISUKE·Filed 2008·Granted May 21, 2013·1 cites·19 claims
- 2448US2016164329A1Power control system, power control method and recording mediumNEC CORP·Filed 2014·Application pending·0 cites
- 2547US11486915B2State estimation apparatus, method, and programNEC CORP·Filed 2018·Granted Nov 1, 2022·0 cites·7 claims
- 2647US10712375B2Data processing device, data processing method, and non-transitory storage mediumNEC CORP·Filed 2016·Granted Jul 14, 2020·0 cites·11 claims
- 2746US10750251B2Information providing apparatus, information providing method, and storage mediumNEC CORP·Filed 2016·Granted Aug 18, 2020·0 cites·20 claims
- 2846US10069302B2Power flow control system and power flow control methodNEC CORP·Filed 2013·Granted Sep 4, 2018·0 cites·19 claims
- 2944US12149300B2Information processing device, information processing system, information processing method, and programNEC CORP·Filed 2020·Granted Nov 19, 2024·0 cites·9 claims
- 3044US10114051B2Monitoring device, monitoring system, monitoring method, and non-transitory storage mediumNEC CORP·Filed 2015·Granted Oct 30, 2018·0 cites·13 claims
- 3142US9946286B2Information processing apparatus, power-consuming body, information processing method, and programNEC CORP·Filed 2013·Granted Apr 17, 2018·0 cites·28 claims
- 3241US10401403B2Monitoring device, monitoring system, monitoring method, and non-transitory storage mediumNEC CORP·Filed 2015·Granted Sep 3, 2019·0 cites·13 claims
- 3340US2021278832A1Maintenance plan formulation device, method, and non-transitory mediumNEC CORP·Filed 2017·Application pending·0 cites
- 3440US2019324070A1State estimation apparatus, state estimation method, and non-transitory mediumNEC CORP·Filed 2017·Application pending·0 cites
- 3538US2014218060A1Degradation diagnosing circuit and degradation diagnosing methodSANEYOSHI EISUKE·Filed 2012·Application pending·0 cites
- 3638US2018254661A1Information output apparatus, and information output methodNEC CORP·Filed 2016·Application pending·0 cites
- 3738US2013002274A1Aging degradation diagnosis circuit and aging degradation diagnosis method for semiconductor integrated circuitNEC CORP·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →