Inventor · disambiguated record
Eisuke Tomita
Also filed as: TOMITA EISUKE
12 granted patents·469 citations·filing 1988–2000
93Inventor score
Top patents by PatentIndex Score
12 records- 0187US5894122AScanning near field optical microscopeSEIKO INSTR INC·Filed 1997·Granted Apr 13, 1999·106 cites·44 claims
- 0277US6249000B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Jun 19, 2001·56 cites·28 claims
- 0376US6194711B1Scanning near-field optical microscopeSEIKO INSTR INC·Filed 1998·Granted Feb 27, 2001·54 cites·52 claims
- 0472US6201227B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Mar 13, 2001·44 cites·3 claims
- 0572US4969978AApparatus and method for tunnel current measurement observed simultaneously with electrochemical measurementSEIKO INSTR INC·Filed 1988·Granted Nov 13, 1990·33 cites·12 claims
- 0671US6257053B1Scanning probe microscope having piezoelectric member for controlling movement of probeSEIKO INSTR INC·Filed 1999·Granted Jul 10, 2001·41 cites·28 claims
- 0770US5804708AAtomic force microscope and method of analyzing frictions in atomic force microscopeAGENCY IND SCIENCE AND SEIKO I·Filed 1995·Granted Sep 8, 1998·45 cites·12 claims
- 0869US5120959AApparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe thereforSEIKO INSTR INC·Filed 1990·Granted Jun 9, 1992·30 cites·23 claims
- 0967US5623205AMethod and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic fieldSEIKO INSTR INC·Filed 1994·Granted Apr 22, 1997·27 cites·18 claims
- 1059US6373246B1Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensorSEIKO INSTR INC·Filed 2000·Granted Apr 16, 2002·3 cites·17 claims
- 1156US6081113ACantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic materialSEIKO INSTR INC·Filed 1994·Granted Jun 27, 2000·9 cites·7 claims
- 1256US5990477AApparatus for machining, recording, and reproducing, using scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Nov 23, 1999·21 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →