Inventor · disambiguated record
Eiji Tsujimura
Also filed as: TSUJIMURA EIJI
1 granted patent·2 pending applications·11 citations·filing 1999–2024
33Inventor score
Files withANRITSU CORP3
Top patents by PatentIndex Score
3 records- 0152US2024328967A1X-ray inspection apparatus and x-ray inspection systemANRITSU CORP·Filed 2024·Application pending·0 cites
- 0249US2024114913A1Article inspection systemANRITSU CORP·Filed 2023·Application pending·0 cites
- 0323US6862098B1Apparatus and method for measuring displacementANRITSU CORP·Filed 1999·Granted Mar 1, 2005·11 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →