Inventor · disambiguated record
Elwin M. Beaty
Also filed as: BEATY ELWIN M
17 granted patents·560 citations·filing 1991–2007
96Inventor score
Files withBEATY ELWIN M4SCANNER TECHNOLOGIES CORP4BEATY BUTCH1ELWIN BEATY & ELAINE BEATY1PALM STEVEN G1
Top patents by PatentIndex Score
17 records- 0192US5574668AApparatus and method for measuring ball grid arraysFiled 1995·Granted Nov 12, 1996·107 cites·20 claims
- 0288US5909285AThree dimensional inspection systemFiled 1997·Granted Jun 1, 1999·79 cites·33 claims
- 0386US6072898AMethod and apparatus for three dimensional inspection of electronic componentsFiled 1998·Granted Jun 6, 2000·72 cites·41 claims
- 0483US7085411B2Method of manufacturing electronic components including a method for three dimensional inspectionSCANNER TECHNOLOGIES CORP·Filed 2005·Granted Aug 1, 2006·11 cites·126 claims
- 0583US6915006B2Method and apparatus for three dimensional inspection of electronic componentsFiled 2001·Granted Jul 5, 2005·28 cites·147 claims
- 0682US7079678B2Electronic component products made according to a process that includes a method for three dimensional inspectionSCANNER TECHNOLOGIES CORP·Filed 2005·Granted Jul 18, 2006·10 cites·126 claims
- 0779US7508974B2Electronic component products and method of manufacturing electronic component productsSCANNER TECHNOLOGIES CORP·Filed 2005·Granted Mar 24, 2009·7 cites·35 claims
- 0877US6064756AApparatus for three dimensional inspection of electronic componentsBEATY ELWIN M·Filed 1999·Granted May 16, 2000·44 cites·30 claims
- 0974US5276546AThree dimensional scanning systemBEATY BUTCH·Filed 1992·Granted Jan 4, 1994·44 cites·9 claims
- 1073US6915007B2Method and apparatus for three dimensional inspection of electronic componentsFiled 2001·Granted Jul 5, 2005·19 cites·105 claims
- 1171US5173796AThree dimensional scanning systemPALM STEVEN G·Filed 1991·Granted Dec 22, 1992·40 cites·5 claims
- 1268US6064757AProcess for three dimensional inspection of electronic componentsBEATY ELWIN M·Filed 1999·Granted May 16, 2000·29 cites·30 claims
- 1367US6055054AThree dimensional inspection systemFiled 1997·Granted Apr 25, 2000·31 cites·27 claims
- 1458US6862365B1Method and apparatus for three dimensional inspection of electronic componentsELWIN BEATY & ELAINE BEATY·Filed 1999·Granted Mar 1, 2005·22 cites·45 claims
- 1555US7653237B2Method of manufacturing ball array devices using an inspection apparatus having two or more cameras and ball array devices produced according to the methodSCANNER TECHNOLOGIES CORP·Filed 2007·Granted Jan 26, 2010·2 cites·38 claims
- 1655US7570798B2Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the methodBEATY ELWIN M·Filed 2007·Granted Aug 4, 2009·2 cites·36 claims
- 1746US5307149AMethod and apparatus for zero force part placementBEATY ELWIN M·Filed 1992·Granted Apr 26, 1994·13 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →