Inventor · disambiguated record
Elad Cohen
Also filed as: COHEN ELAD
11 granted patents·1 pending application·17 citations·filing 2015–2023
83Inventor score
Top patents by PatentIndex Score
12 records- 0185US10957034B2Method of examination of a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Mar 23, 2021·5 cites·20 claims
- 0281US10460434B2Method of defect detection and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Oct 29, 2019·5 cites·20 claims
- 0363US10290087B2Method of generating an examination recipe and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 14, 2019·1 cites·20 claims
- 0461US10284545B2Secure network access using credentialsARRIS ENTPR LLC·Filed 2016·Granted May 7, 2019·1 cites·27 claims
- 0560US10853932B2Method of defect detection on a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Dec 1, 2020·1 cites·20 claims
- 0660US10285059B2MAC address determination using a personal WLANARRIS ENTPR LLC·Filed 2017·Granted May 7, 2019·1 cites·20 claims
- 0753US10942834B2Real-time personalization product tracking B2B/B2CGAINSIGHT INC·Filed 2018·Granted Mar 9, 2021·2 cites·20 claims
- 0852US11303662B2Security indicator scoresENTIT SOFTWARE LLC·Filed 2015·Granted Apr 12, 2022·1 cites·15 claims
- 0952US2025166154A1Defect detection using a machine learning algorithmAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1044US12272042B2Detection of defects using a computationally efficient segmentation approachAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 1142US11107207B2Detecting targeted locations in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 1240US11386539B2Detecting defects in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 12, 2022·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Elad Cohen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →