Inventor · disambiguated record
Elida Isabel De Obaldia
Also filed as: DE OBALDIA ELIDA I · DE OBALDIA ELIDA ISABEL
4 granted patents·1 pending application·65 citations·filing 2004–2010
77Inventor score
Top patents by PatentIndex Score
5 records- 0188US7254755B2On-chip receiver sensitivity test mechanismTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 7, 2007·39 cites·31 claims
- 0282US7958408B2On-chip receiver sensitivity test mechanismTEXAS INSTRUMENTS INC·Filed 2007·Granted Jun 7, 2011·9 cites·10 claims
- 0372US7813462B2Method of defining semiconductor fabrication process utilizing transistor inverter delay periodTEXAS INSTRUMENTS INC·Filed 2006·Granted Oct 12, 2010·8 cites·11 claims
- 0466US7035750B2On-chip test mechanism for transceiver power amplifier and oscillator frequencyTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 25, 2006·9 cites·30 claims
- 0534US2011193200A1Semiconductor wafer chip scale package test flow and dicing processLYNE KEVIN P·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →