Inventor · disambiguated record
Elancheren Durai
Also filed as: DURAI ELANCHEREN
8 granted patents·1 pending application·11 citations·filing 2018–2025
79Inventor score
Top patents by PatentIndex Score
9 records- 0182US10585835B1Methods and apparatuses for independent tuning of on-die termination impedances and output driver impedances, and related semiconductor devices and systemsMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 10, 2020·6 cites·20 claims
- 0275US11948661B2Methods for tuning command/address bus timing and memory devices and memory systems using the sameMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 2, 2024·1 cites·45 claims
- 0373US2025272006A1Apparatus with post-manufacturing data update mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0471US11238909B2Apparatuses and methods for setting operational parameters of a memory included in a memory module based on location informationMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 1, 2022·2 cites·23 claims
- 0570US12307102B2Apparatus with post-manufacturing data update mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2024·Granted May 20, 2025·0 cites·20 claims
- 0666US11416250B2Method and apparatus in memory for input and output parameters optimization in a memory system during operationMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 16, 2022·2 cites·21 claims
- 0764US12271734B2Method and apparatus in memory for input and output parameters optimization in a memory system during operationLODESTAR LICENSING GROUP LLC·Filed 2022·Granted Apr 8, 2025·0 cites·20 claims
- 0864US12001686B2Apparatus with post-manufacturing data update mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 4, 2024·0 cites·20 claims
- 0959US11030141B2Apparatuses for independent tuning of on-die termination impedances and output driver impedances, and related methods, semiconductor devices, and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →