Inventor · disambiguated record
Eli Kaminsky
Also filed as: KAMINSKY ELI
1 granted patent·1 pending application·0 citations·filing 2016–2023
9Inventor score
Technology areasG06T
Top patents by PatentIndex Score
2 records- 0141US2025200741A1Fourier transform based machine learning for defect examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0238US10902642B2Alignment of images of a calibration image using a patternHP INDIGO BV·Filed 2016·Granted Jan 26, 2021·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →