Inventor · disambiguated record
Emad Zawaideh
Also filed as: ZAWAIDEH EMAD · ZAWAIDEH EMAD S
11 granted patents·2 pending applications·179 citations·filing 1996–2023
90Inventor score
Top patents by PatentIndex Score
13 records- 0186US7505133B1Optical metrology systems and methodsSCI INSTR INC·Filed 2004·Granted Mar 17, 2009·36 cites·13 claims
- 0277US8319966B2Optical metrology systems and methodsZAWAIDEH EMAD·Filed 2009·Granted Nov 27, 2012·8 cites·16 claims
- 0373US6140832AMethod of utilizing IDDQ tests to screen out defective partsRAYTHEON CO·Filed 1998·Granted Oct 31, 2000·40 cites·2 claims
- 0469US5889592ANondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer filmsFiled 1998·Granted Mar 30, 1999·34 cites·17 claims
- 0568US5999267ANondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer filmsFiled 1999·Granted Dec 7, 1999·31 cites·3 claims
- 0666US8330959B2Multi-channel surface plasmon resonance instrumentCLAYPOOL CHRISTOPHER L·Filed 2010·Granted Dec 11, 2012·2 cites·20 claims
- 0766US7463355B1Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin filmsSCIENT COMPUTING INTERNAT·Filed 2003·Granted Dec 9, 2008·16 cites·17 claims
- 0857US2023324283A1Spectroscopic ellipsometry system for thin film imagingBRUKER NANO INC·Filed 2023·Application pending·0 cites
- 0952US12306092B2Imaging spectropolarimeter and sample characterization methodology utilizing the sameBRUKER NANO INC·Filed 2022·Granted May 20, 2025·0 cites·11 claims
- 1043US5877557ALow temperature aluminum nitrideRAYTHEON CO·Filed 1996·Granted Mar 2, 1999·12 cites·5 claims
- 1138US11668645B2Spectroscopic ellipsometry system for thin film imagingBRUKER NANO INC·Filed 2017·Granted Jun 6, 2023·0 cites·22 claims
- 1229US11499870B2Imaging spectropolarimeterZAWAIDEH MAZEN·Filed 2018·Granted Nov 15, 2022·0 cites·10 claims
- 1327US2016076942A1Imaging spectropolarimeterZAWAIDEH MAZEN·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →