Inventor · disambiguated record
Engmin J. Chern
Also filed as: CHERN ENGMIN J · CHERN ENGMIN JAMES
6 granted patents·225 citations·filing 1986–1996
86Inventor score
Top patents by PatentIndex Score
6 records- 0189US4755753AEddy current surface mapping system for flaw detectionGEN ELECTRIC·Filed 1986·Granted Jul 5, 1988·92 cites·17 claims
- 0285US5339031AMethod and apparatus for non-contact hole eccentricity and diameter measurementUS ARMY·Filed 1992·Granted Aug 16, 1994·61 cites·20 claims
- 0364US5750895AMethod and apparatus for dual amplitude dual time-of-flight ultrasonic imagingUS ARMY·Filed 1996·Granted May 12, 1998·33 cites·19 claims
- 0455US5124640AMethod for advanced material characterization by laser induced eddy current imagingUS OF AMERICAS AS REPRESENTED·Filed 1991·Granted Jun 23, 1992·20 cites·4 claims
- 0544US5214379AMethod and apparatus for deflection measurements using eddy current effectsNASA·Filed 1992·Granted May 25, 1993·12 cites·19 claims
- 0633US5193395AMethod and apparatus for determination of material residual stressNASA·Filed 1991·Granted Mar 16, 1993·7 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →