Inventor · disambiguated record
Eng Ling Ho
Also filed as: HO ENG LING
9 granted patents·37 citations·filing 2005–2019
84Inventor score
Top patents by PatentIndex Score
9 records- 0187US9588176B1Techniques for using scan storage circuitsALTERA CORP·Filed 2015·Granted Mar 7, 2017·9 cites·31 claims
- 0281US7218134B1Adjustable data loading circuit with dynamic test mode switching for testing programmable integrated circuitsALTERA CORP·Filed 2005·Granted May 15, 2007·11 cites·18 claims
- 0376US7620853B1Methods for detecting resistive bridging faults at configuration random-access memory output nodesALTERA CORP·Filed 2007·Granted Nov 17, 2009·13 cites·20 claims
- 0463US10355909B1Configuration of a programmable deviceINTEL CORP·Filed 2017·Granted Jul 16, 2019·1 cites·20 claims
- 0556US8543878B1Apparatus and a method to test a parametric structure utilizing logical sensingHO ENG LING·Filed 2011·Granted Sep 24, 2013·2 cites·20 claims
- 0651US10938620B2Configuration of a programmable deviceINTEL CORP·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 0750US7317327B1Adjustable data loading circuit with dynamic test mode switching for testing programmable integrated circuitsALTERA CORP·Filed 2007·Granted Jan 8, 2008·1 cites·12 claims
- 0839US10866608B2Apparatus and method of voltage regulation control for integrated circuitINTEL CORP·Filed 2016·Granted Dec 15, 2020·0 cites·18 claims
- 0939US10218358B2Methods and apparatus for unloading data from a configurable integrated circuitINTEL CORP·Filed 2017·Granted Feb 26, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →