Inventor · disambiguated record
Eng Keong Ho
Also filed as: HO ENG KEONG
3 granted patents·1 pending application·0 citations·filing 2003–2011
44Inventor score
Top patents by PatentIndex Score
4 records- 0132US7400391B2System and method for detection of spatial signature yield lossSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Jul 15, 2008·0 cites·20 claims
- 0230US7211450B2System and method for detection of spatial signature yield lossSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted May 1, 2007·0 cites·12 claims
- 0328US8564043B2EEPROM cell structure and a method of fabricating the sameHUANG SHENG HE·Filed 2011·Granted Oct 22, 2013·0 cites·8 claims
- 0423US2006168484A1System and method for process degradation problematic tool identificationHO ENG KEONG·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →