Inventor · disambiguated record
Enrico Novarini
Also filed as: NOVARINI ENRICO
2 granted patents·6 citations·filing 1992–1998
51Inventor score
Top patents by PatentIndex Score
2 records- 0131US6236225B1Method of testing the gate oxide in integrated DMOS power transistors and integrated device comprising a DMOS power transistorST MICROELECTRONICS SRL·Filed 1998·Granted May 22, 2001·4 cites·22 claims
- 0227US5350998AStructure for temperature compensating the inverse saturation current of bipolar transistorsSGS THOMSON MICROELECTRONICS·Filed 1992·Granted Sep 27, 1994·2 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →